ВЛИЯНИЕ ИНТЕРФЕРЕНЦИИ В ТОНКИХ ПЛЕНКАХ НА ОПТИЧЕСКИЕ ХАРАКТЕРИСТИКИ ГОЛОГРАММ, ЗАРЕГИСТРИРОВАННЫХ НА СЛЯХ As-Se

Abstract

The effect of interference in thin films on the optical characteristics of holograms recorded on a chalcogenide glassy semiconductor the layers of the As-Se system has been evaluated. The changes in the magnitude of reflection, transmission and optical difference of the course of the rays during the action of actinic He-Ne laser radiation on the layers are measured. It is shown that interference phenomena in thin films lead to fluctuations in these characteristics, as well as to fluctuations in the diffraction efficiency of holograms when the layer thickness changes.